W7701-278160 Beam-Based Microscopes
Public summary
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PWGSC, on behalf of Defence Research and Development Canada (DRDC), is seeking proposals for specialized microscopy equipment. The requirement appears to include: (1) a dual-beam system combining a Scanning Electron Microscope (SEM) and a Focused Ion Beam (FIB), and (2) a separate tabletop SEM. The supplier would also be expected to provide delivery to Quebec, installation, and training, in accordance with the Statement of Requirements Annex. Key details: -Tender: W7701-278160 – Beam-Based Microscopes -Buyer: Public Works and Government Services Canada (PWGSC) -Status: Open -Delivery location: Quebec, excluding the National Capital Region, with Gatineau, Quebec identified -Closing date: November 9, 2026 at 2:00 p.m. -Category: Goods (GD) This opportunity potentially matches businesses that supply advanced SEM/FIB laboratory equipment and can provide the required implementation, training, and delivery services. The available listing does not include the tender documents, technical specifications, evaluation criteria, contract terms, or submission instructions. Review the official notice and all referenced annexes carefully to confirm the exact requirements, applicable eligibility conditions, procurement process, and deadline before deciding whether to submit a bid.Official notice: https://portal.us.bn.cloud.ariba.com/dashboard/public/appext/comsapsbncdiscoveryui#/Rfx Event/preview/1110028517?an Id=ANONYMOUS
Requirement preview
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- The procurement appears to seek a Dualbeam system comprising a Scanning Electron Microscope (SEM) and a Focused Ion Beam (FIB).
- A separate table-top Scanning Electron Microscope appears to be required.
- Installation is included in the requested scope.
- Training is included in the requested scope.
Source description preview
Imported source text may contain formatting from the original notice.
Public Works and Government Services Canada (PWGSC), on behalf of Defence Research and Development Canada (DRDC), is issuing this Request for Proposal (RFP) for the acquisition of a Dualbeam system consisting of a Scanning Electron Microscope and a Focused Ion Beam, as well as a separate Table-top Scanning Electron Microscope, including installation, training and delivery to Québec (QC), as detailed in the Statement of Requirements Annex.
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